Using Atomic Force Microscopy to Measure Thickness of Passive Film on Stainless Steel Immersed in Aqueous Solution
نویسندگان
چکیده
منابع مشابه
XPS Analysis of Passive Film on Stainless Steel
Potentiodynamic, impedance measurements were carried out on 304 stainless steel in 0.5N, 1.0, 2.0 and 5.0 N H2SO4 solutions. X-ray photoelectron spectroscopic [XPS] studies carried out on 304 stainless steel in H2SO4 solutions revealed the existence of CrOOH, Cr2O3, -Fe2O3, FeOOH, Mn2O3, Mn3O4, MnS, Ni (OH)2, Ni2O3, NiO, sulphides. The passive film found to contain chromium oxide inner layer an...
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ژورنال
عنوان ژورنال: Scientific Reports
سال: 2019
ISSN: 2045-2322
DOI: 10.1038/s41598-019-49747-0